working with the JEOL JEM-2200FS; Copyright: Gillian Kiliani

electron and optical microscopy

ideal techniques for visualization of surfaces and crystal structures on different scales

We employ two scanning electron microscopes (SEM) with a focused ion beam column (FIB), two transmission electron microscopes (TEM) and an optical microscope to image micro- and nanoscale devices.  Our TEM are managed by the department of chemistry.