the JEOL JEM-2200FS; Copyright: Gillian Kiliani

HR-TEM (JEOL JEM-2200FS)

  • 200 kV, high resolution pole piece
  • FEG with ZrO/W(100) Schottky emitter
  • point resolution: 0.23 nm
  • in-column Omega-type filter, EELS and EFTEM
  • EDS with 0.23sr solid angle
  • STEM with BF- and HAADF- detector
  • cryo-TEM

TEM (Zeiss Libra120)

  • 120 kV LaB6 emitter with Koehler illumination system
  • resolution: 0.34 nm
  • information limit: <0.20 nm
  • in-column Omega filter
  • high precision 4-axes Goniometer stage
  • fully analytical EFTEM with operation modes for imaging, diffraction and EELS
  • cryo-TEM